Cart (Loading....) | Create Account
Close category search window

Magnetic field penetration in a long Josephson junction imbedded in a wide stripline

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Franz, Andreas ; Physikalisches Institut III, Universität Erlangen-Nürnberg, D-91058 Erlangen, Germany ; Wallraff, Andreas ; Ustinov, A.V.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The dependence of the first critical field of long linear and annular Josephson junctions on the width of the surrounding stripline, the so called idle region, is investigated experimentally. The stripline modifies the effective Josephson length λeff in the junction. The experimental data are compared with the theory by Caputo etal [J. Appl. Phys. 85, 7291 (1999)] and good agreement is found. The dependence of the first critical field on the width of the surrounding stripline can be well explained using the same λeff for both annular and linear junctions. © 2001 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:89 ,  Issue: 1 )

Date of Publication:

Jan 2001

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.