By Topic

Optical absorption and light scattering in microcrystalline silicon thin films and solar cells

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
9 Author(s)
Poruba, A. ; Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnická 10, CZ-162 53 Praha 6, Czech Republic ; Fejfar, A. ; Remes, Z. ; Springer, J.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.373635 

Optical characterization methods were applied to a series of microcrystalline silicon thin films and solar cells deposited by the very high frequency glow discharge technique. Bulk and surface light scattering effects were analyzed. A detailed theory for evaluation of the optical absorption coefficient α from transmittance, reflectance and absorptance (with the help of constant photocurrent method) measurements in a broad spectral region is presented for the case of surface and bulk light scattering. The spectral dependence of α is interpreted in terms of defect density, disorder, crystalline/amorphous fraction and material morphology. The enhanced light absorption in microcrystalline silicon films and solar cells is mainly due to a longer optical path as the result of an efficient diffuse light scattering at the textured film surface. This light scattering effect is a key characteristic of efficient thin-film-silicon solar cells. © 2000 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:88 ,  Issue: 1 )