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Observation of magnetization reversal processes in Co–Cr and Co–Cr–Ta ultrathin films under the canted magnetic field using anomalous Hall effect

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4 Author(s)
Nakagawa, Shigeki ; Department of Physical Electronics, Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro, Tokyo 152-8552, Japan ; Sato, Atsushi ; Sasaki, Ichiro ; Naoe, Masahiko

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Normalized magnetization vector Me of ultrathin Co–Cr–Ta films under the canted magnetic field were derived from the results of anomalous Hall voltage and the magnetization measured by a vibrating sample magnetometer. The film deposited at high substrate temperature revealed a relatively large amount of an in-plane component because of the faint c-axis orientation in the perpendicular direction of the Co–Cr–Ta crystallites. The in-plane component at the remanent state seems to be larger for the film with worse c-axis orientation. The Pt underlayer was normalized to promote c-axis orientation in Co–Cr–Ta films deposited on it at a high substrate temperature above 200 °C. A 30 nm-thick Co77Cr20Ta3 film deposited on a 20-nm-thick Pt underlayer exhibited large perpendicular coercivity. The locus of normalized magnetization of the Co77Cr20Ta3(30 nm)/Pt(20 nm) implied that the film revealed a large perpendicular magnetization component even though the magnetic field was applied in the direction out of the normal line. © 2000 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:87 ,  Issue: 9 )

Date of Publication:

May 2000

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