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Observations of reaction zones at chromium/oxide glass interfaces

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2 Author(s)
Jiang, Nan ; School of Applied and Engineering Physics and Cornell Center for Materials Research, Cornell University, Ithaca, New York 14853 ; Silcox, John

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.372412 

Cr is often used in thin metallic film structures on oxide glasses since it exhibits good adhesion. The most likely explanation of the basic adhesion mechanism is the formation of a graded metal oxide layer at the interface. In general, details of the interface properties are needed to get a complete understanding of phenomena such as adhesion. We report here observations of interface structures using spatially resolved electron energy loss spectrometry with a small probe (2 Å) scanning transmission electron microscope. Two interfaces, evaporated Cr/alkaline earth boroaluminosilicate glass and sputtered Cr/barium boroaluminosilicate glass, are examined. As expected from the classical adhesion theory, very thin partially oxidized intermediate layers are seen in both samples. However, a 5 nm Cr diffusion layer is also found in the evaporated Cr/glass system (without heat treatment), but it appears absent in the sputtered Cr glass system (with heat treatment). This difference suggests that the mechanisms of the adhesion of Cr to oxide glass are dependent on interface history. © 2000 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:87 ,  Issue: 8 )

Date of Publication:

Apr 2000

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