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Response to “Comment on ‘Analysis of high-resolution x-ray diffraction in semiconductor strained layers’ ” [J. Appl. Phys. 87, 8212 (2000)]

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2 Author(s)
Dunstan, D.J. ; Department of Physics, Queen Mary and Westfield College, University of London, London E1 4NS, England, United Kingdom ; Kimber, A.C.

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The author of the comment is confused about a paradox and a philosophical error he identifies in our multivariate linear regression analysis of data. In this response, we clarify the issue, showing that the alleged paradox arises equally in a single-variate regression analysis and even in the use of repeated measurements to give a mean and standard deviation. We clarify also the question of best choices of reflections. © 2000 American Institute of Physics.

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Journal of Applied Physics  (Volume:87 ,  Issue: 11 )