Cart (Loading....) | Create Account
Close category search window
 

Correlation between tip-apex shape and surface modification by scanning tunneling microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Heike, Seiji ; Advanced Research Laboratory, Hitachi, Ltd., 2520 Akanuma, Hatoyama, Saitama 350-0395, JapanCREST, Japan Science and Technology Corporation (JST), 2520 Akanuma, Hatoyama, Saitama 350-0395, Japan ; Wada, Y. ; Hashizume, Tomihiro

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.371349 

The correlation between the shape of a probe tip apex for scanning tunneling microscopy and the surface modification patterns on a Si(111)-7×7 surface is demonstrated by using an in situ tip evaluation technique. The tip apex is inversely imaged by using a very sharp nanoneedle fabricated on the sample surface by applying a high voltage between the tip and the surface. When a large current of 100–300 nA flows between the tip and the surface, silicon atoms on the surface are extracted and a trench pattern is formed. The trench pattern agrees well with the geometry of the tip apex. The correlation between the tip shape and the fabrication pattern is discussed in terms of the electric field under the tip. © 1999 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:86 ,  Issue: 8 )

Date of Publication:

Oct 1999

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.