By Topic

Removing optical artifacts in near-field scanning optical microscopy by using a three-dimensional scanning mode

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
4 Author(s)
Jordan, Claire E. ; Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899 ; Stranick, Stephan J. ; Richter, L.J. ; Cavanagh, Richard R.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.371126 

We demonstrate a method of acquiring near-field scanning optical microscopy data that allow for the construction of three different types of images from one data set: topographic, constantgap, and constant-height. This data set includes the topographic features of the surface and the optical response at various heights above the sample surface. Comparisons are made between the images recorded in this format and both conventional, constant-gap mode images, and pseudoconstant-height mode images constructed using a single retraction curve. Zmotion artifacts are identified by analyzing the optical intensity for a given image as a function of the sample topography. Using this procedure it is shown that significant z-motion artifacts exist in the constant-gap images of gold particles immobilized on a glass slide. These artifacts are avoided by constructing constant-height images.

Published in:

Journal of Applied Physics  (Volume:86 ,  Issue: 5 )