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A correlative study of the electrically active grain boundary structure of ZnO polycrystals has been carried out using a scanning electron microscope/scanning tunneling microscope (SEM/STM) combined instrument. Current imaging tunneling spectroscopy (CITS) measurements reveal reduced surface band gaps, as compared with grain interiors, at the charged boundaries imaged by SEM-based remote electron beam induced current (REBIC). ZnO grain boundaries were also imaged in the STM-REBIC mode with a resolution of up to 20 nm. The contrast differences observed in the SEM-REBIC and STM-REBIC images are discussed in terms of the different experimental conditions used in both techniques. © 1999 American Institute of Physics.
Published in:
Journal of Applied Physics
(Volume:86
,
Issue:
4
)
Date of Publication: Aug 1999
- Page(s):
- 1874 - 1877
- ISSN :
- 0021-8979
- Digital Object Identifier :
- 10.1063/1.370982
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 18 June 2009
- Issue Date :
- Aug 1999
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