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Bandwidth enhancement of a shear-force-controlled distance regulation in near-field microscopy

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5 Author(s)
Lippitz, M. ; Fachbereich Physik und Wissenschaftliches Zentrum für Materialwissenschaften der Philipps-Universität, Renthof 5, D-35032 Marburg, Germany ; Schuttler, M. ; Giessen, H. ; Born, M.
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The distance between sample and probe in a scanning near-field optical microscope is regulated via tracing the shear-force on the tip which is glued to a tuning fork piezo. A lock-in technique is used. We demonstrate that the bandwidth of the control loop is increased if not only amplitude or phase, but a favorable combination of both is used as feedback signal. The enhancement of bandwidth is connected with a reduction of signal-to-noise ratio. The optimum combination of both, bandwidth and signal-to-noise ratio, can be adjusted purely electronically to the specific needs of an experiment. A theoretical model is developed that discloses the relation between the mechanical and electrical properties of the combination of tuning fork and fiber tip. The frequency response of the shear-force detection system is calculated with a numerical simulation based on this model. Experimental frequency response curves are well fitted by these simulations. Our results are especially important for low-temperature scanning microscopy, where the bandwidth enhancement is essential for obtaining a reasonable scanning speed. © 1999 American Institute of Physics.

Published in:
Journal of Applied Physics  (Volume:86 ,  Issue: 1 )

Date of Publication: Jul 1999

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