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Processing-induced magnetic structures in amorphous metallic alloys are of interest because of their impact on the performance of materials used in electric device applications. Plastic deformation associated with cutting or bending the material to the desired shape occurs through the formation of shear bands. The stress associated with these shear bands induces magnetic domains that can lead to power losses through interaction with the fields and currents involved in normal device operation. These domains have been studied previously using a variety of techniques capable of imaging magnetic domain structures. In an effort to better characterize and understand these issues, we have applied atomic and magnetic force microscopy to these materials to provide three-dimensional nanometer-scale topographic resolution and micrometer-scale magnetic resolution. © 1999 American Institute of Physics.