By Topic

Measurements of charge accumulation induced by monochromatic low-energy electrons at the surface of insulating samples

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Bass, A.D. ; MRC Group in the Radiation Sciences, Faculty of Medicine, Université de Sherbrooke, Sherbrooke, Québec, J1H 5N4, Canada ; Cloutier, P. ; Sanche, L.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.368388 

We investigate charging of insulators with an apparatus that allows measurements of trapped charges resulting from the impact of monoenergetic electrons of 0.1–28 eV. Details are given on the construction and operation of this instrument. A high-resolution electron monochromator provides a pulsed electron beam of variable energy and current. Accumulated surface charge is monitored using a Kelvin probe and a high-sensitivity electrometer. An ultraviolet source of adjustable maximum frequency allows the sample to be discharged for multiple measurements on the same sample. We illustrate the use of the instrument with preliminary measurements for ∼100 μm thick samples cut from an industrial polyethylene cable. The incident electron-energy dependence of the trapping probability exhibits large variation and indicates that electrons with energies ≪5 eV are the most efficiently trapped; charging near 10 eV is attributed to dissociative electron attachment to polyethylene molecules. © 1998 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:84 ,  Issue: 5 )