Close category search window
 

Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Sader, John Elie ; Department of Mathematics and Statistics, University of Melbourne, Parkville, 3052, Victoria, Australia

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.368002 

The vibrational characteristics of a cantilever beam are well known to strongly depend on the fluid in which the beam is immersed. In this paper, we present a detailed theoretical analysis of the frequency response of a cantilever beam, that is immersed in a viscous fluid and excited by an arbitrary driving force. Due to its practical importance in application to the atomic force microscope (AFM), we consider in detail the special case of a cantilever beam that is excited by a thermal driving force. This will incorporate the presentation of explicit analytical formulae and numerical results, which will be of value to the users and designers of AFM cantilever beams. © 1998 American Institute of Physics.

Published in:
Journal of Applied Physics  (Volume:84 ,  Issue: 1 )

Date of Publication: Jul 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.