Cart (Loading....) | Create Account
Close category search window
 

Optimal control of ultrasoft cantilevers for force microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Bruland, K.J. ; Department of Mechanical Engineering, University of Washington, Seattle, Washington 98195 ; Garbini, J.L. ; Dougherty, W.M. ; Sidles, J.A.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.367152 

The goals of optimal control in force microscopy are: (1) to obtain favorable cantilever dynamic properties and (2) to control the cantilever to a desired amplitude, while (3) exerting as little control force as possible, and (4) preserving the force signal-to-noise ratio of the uncontrolled cantilever. This article describes the experimental implementation of an optimal controller that achieves these goals. The application of this controller to an ultrasoft cantilever with spring constant of 110 μN/m at 10 K reduced the resonant quality from 15 000 to 220, reduced the Brownian amplitude from 11.2 Å to 1.4 Å, used less than 7×10-17 N of control effort, left the force sensitivity unaltered at

9.8×10-18 N/  Hz
, and demonstrated feedback control can force cantilever motion to track a reference input. © 1998 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:83 ,  Issue: 8 )

Date of Publication:

Apr 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.