By Topic

Structural and optical characterization of epitaxial waveguiding BaTiO3 thin films on MgO

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
7 Author(s)
Beckers, L. ; Institut für Schicht- und Ionentechnik (ISI), Forschungszentrum Jülich, D-52425 Jülich, Germany ; Schubert, J. ; Zander, W. ; Ziesmann, J.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.367099 

Epitaxial waveguide structures of c-axis oriented BaTiO3 thin films on MgO(001) have been grown by pulsed laser deposition. The structural properties of the samples have been characterized by Rutherford backscattering spectrometry/ion channeling (RBS/C), x-ray diffraction, and atomic force microscopy. We found excellent crystalline quality even up to thicknesses of a few microns. This has been confirmed by RBS/C minimum yield values of 2%–3%, a full width at half maximum of 0.36° of the BaTiO3 (002) rocking curve, and a rms roughness of 1.1 nm for a 950 nm BaTiO3 film. The out-of-plane refractive index was measured to be close to the extraordinary bulk value with the birefringence being about one third of the bulk value. Waveguide losses of 2.9 dB/cm have been demonstrated. © 1998 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:83 ,  Issue: 6 )