By Topic

Reflection-mode scanning near-field optical microscopy: Influence of sample type, tip shape, and polarization of light

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Durkan, C. ; Department of Physics, Trinity College, Dublin 2, Ireland ; Shvets, I.V.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

A reflection-mode aperture-type scanning near-field optical microscope (R-SNOM) based on the external collection of the reflected light is presented. The light detection is based on an elliptical mirror setup, with the tip and sample at one focus, and a photomultiplier tube at the other. Results are presented on the general imaging properties of this microscope. The results presented concentrate on an analysis of the gap-width dependence of the optical signal, on resolution and on the contrast mechanisms which may be used in R-SNOM imaging, including reflectivity, polarization/magneto-optics, and topographic effects. © 1998 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:83 ,  Issue: 3 )