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We measure the refractive index and the absorption of porous silicon layers in the millimetric and submillimetric wavelength range using the terahertz time-domain spectroscopy technique. For the studied range of porosity (55%–76%), the refractive index of porous silicon is rather well described by mixture theories, in which the refractive index of bulk silicon enters as a main parameter. © 1998 American Institute of Physics.
Published in:
Journal of Applied Physics
(Volume:83
,
Issue:
11
)
Date of Publication: Jun 1998
- Page(s):
- 6007 - 6010
- ISSN :
- 0021-8979
- Digital Object Identifier :
- 10.1063/1.367467
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 18 June 2009
- Issue Date :
- Jun 1998
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