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A quantitative analysis of surface deformation by stick/slip atomic force microscopy

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2 Author(s)
Kerssemakers, J. ; Department of Applied Physics, Materials Science Center, University of Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands ; de Hosson, J.Th.M.

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This article presents a quantitative determination of static deformation at a nanometer scale of a surface caused by the tip of an atomic force microscope. An analysis of cantilever displacements while in contact with the surface leads to a directly measurable dimensionless parameter which is well sensitive to surface deformation. The method is specifically aimed at stick/slip friction measurements like on layered compounds, like TiS2 or on a relatively rigid surface of an ionic crystal, in this study NaCl [100]. Stick/slip friction images offer a possibility to investigate details of strain-dependent deformation. The observed deformation in TiS2 could play an important role in the occurrence of strong stick/slip friction in this and other layered materials. © 1997 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:82 ,  Issue: 8 )