By Topic

Measurement of thermal diffusivities of thin metallic films using the ac calorimetric method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
4 Author(s)
Yamane, Tsuneyuki ; Toray Research Center, Inc., Sonoyama 3-3-7, Otsu, Shiga 520, Japan ; Mori, Yuji ; Katayama, Shin-ichiro ; Todoki, Minoru

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.365882 

The thermal diffusivities of thin films of evaporated metal less than 1×10-6 m thick have been measured using the light-irradiation ac calorimetric method. The thermal diffusivities of metallic thin films become smaller than those of the bulk as the thickness of the metallic thin films decreases. It is determined, using x-ray diffraction measurement, that the decrease of thermal diffusivity of thin films of evaporated metal is caused by a decrease in crystalline size. © 1997 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:82 ,  Issue: 3 )