Close category search window
 

Analytical model for the refractive index in quantum wells derived from the complex dielectric constant of Wannier excitons in noninteger dimensions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Tanguy, Christian ; France Telecom, Centre National d’Etudes de Télécommunications, Paris B, Laboratoire de Bagneux, BP 107, 92225 Bagneux Cedex, France ; Lefebvre, P. ; Mathieu, H. ; Elliott, R.J.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.365580 

Absorption spectra of low-dimensional structures such as quantum wells or wires have been strikingly well reproduced by expressions based on solutions of the Schrödinger equation for the Coulomb potential in noninteger dimensions, which require much less computational effort than more elaborate calculations. The compact and analytical complex dielectric constant of Wannier excitons in d dimensions is given, and included in a simple model of the refractive index in quantum well structures in the vicinity of the absorption threshold. © 1997 American Institute of Physics.

Published in:
Journal of Applied Physics  (Volume:82 ,  Issue: 2 )

Date of Publication: Jul 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.