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CuInS2 thin film growth monitoring by in situ electric conductivity measurements

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3 Author(s)
Alt, M. ; Hahn-Meitner Institut, Abteilung Grenzflächen, Glienicker Strasse 100, 14109 Berlin, Germany ; Lewerenz, H.J. ; Scheer, R.

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The growth of CuInS2 thin films by coevaporation has been monitored by in situ electrical conductivity measurements. Films with different cation ratio In/(In+Cu) were investigated. During the controlled cool-down period we obtain conductivity versus temperature data which are completed ex situ in the low-temperature region. The formation of the semimetallic CuS phase in Cu-rich films is found during the cool-down period at a substrate temperature of about 450 K. For In-rich films the dominance of charged grain boundary states is discussed. © 1997 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:81 ,  Issue: 2 )

Date of Publication:

Jan 1997

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