Cart (Loading....) | Create Account
Close category search window

Backscattering of an electromagnetic missile by a metal cylinder of degree higher than two

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Houdzoumis, Vassilios A. ; Gordon McKay Laboratory, Harvard University, Cambridge, Massachusetts 02138‐2901 ; Wu, Tai T. ; Myers, J.M.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The backscattering of an electromagnetic missile from a perfectly conducting curved obstacle is investigated. The obstacle is assumed to have zero curvature just at the point of reflection of the incident pulse. The asymptotic dependence of the backscattered energy is sought, as the distance separating the obstacle from the source of the incident pulse tends to infinity. The backscattered energy is found to depend on the rate at which the energy spectral density of the current pulse at the source decays with increasing frequency, as well as on the degree of flatness of the obstacle at the point of reflection. © 1996 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:80 ,  Issue: 1 )

Date of Publication:

Jul 1996

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.