Cart (Loading....) | Create Account
Close category search window

Thickness vibrations of thin piezoelectric plates and the determination of the electro‐elastic constants of Al0.88Ga0.12PO4 crystal

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Wang, Jin-Feng ; Department of Physics, Shandong University, Jinan, People’s Republic of China ; Liu, Shi‐Fang ; Zhou, Zhi‐Qiang ; Zhong, Wei‐Lie
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Thickness vibrations of thin piezoelectric plates excited by perpendicular or parallel fields have been investigated. In the analyses of the resonances of the thin plates, both the stress boundary and the electrical conditions have been considered. The theory has been applied to the determination of the electro‐elastic constants of a newly developed piezoelectric crystal, Al0.88Ga0.12PO4. © 1996 American Institute of Physics.

Published in:

Journal of Applied Physics  (Volume:79 ,  Issue: 3 )

Date of Publication:

Feb 1996

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.