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Browse Journals & Magazines > Reliability and Quality Contr ...> Volume:RQC-9 Issue:1 Help

Interval Estimation of Product Reliability by Use of the Noncentral t Distribution

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1 Author(s)
Schafer, R.E. ; Semiconductor Div., Hughes Products, Culver City, Calif.

First Page of the Article

Published in:
Reliability and Quality Control, IRE Transactions on  (Volume:RQC-9 ,  Issue: 1 )

Date of Publication: April 1960

Page(s):
77 - 81
ISSN :
0097-4552
Digital Object Identifier :
10.1109/IRE-PGRQC.1960.5007270
Product Type:
Journals & Magazines
Date of Current Version :
29 May 2009
Issue Date :
April 1960

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