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The reliability of error correcting code implementations [IC reliability assessment]

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1 Author(s)
Shooman, M.L. ; Polytechnic Univ., Brooklyn, NY, USA

This paper develops the probability of error expressions for parity bit codes and a single error correcting-single error detecting code, SECSED. A typical coding and decoding circuit involving standard ICs is developed for a parity bit code and a SECSED code. An expression was developed for the probability of undetected errors based on multiple bit errors or coder chip failure. Under certain conditions of bit transmission rate, B, and bit error probability, q, the simpler parity bit coding scheme is superior to the more complex Hamming code scheme. The general conclusion is that for more complex error detection schemes, one should evaluate the effects of generator and checker failures, since these may be of considerable importance for small values of q

Published in:

Reliability and Maintainability Symposium, 1996 Proceedings. International Symposium on Product Quality and Integrity., Annual

Date of Conference:

22-25 Jan 1996