By Topic

EM Transient Protection Requirements for Avionics LRUs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
George W. Ketterling ; Boeing Military Airplane Company, Seattle, Washington 98121 ; Raymond C. Vogel ; Shirley M. Briggs

Avionics and electronic equipment installed in aircraft and air breathing missiles are required to operate without upset or damage when subjected to EM environments caused by lightning, NEMP, and Intrasystems transients. To simplify the design effort required to protect electronic equipment and minimize overlapping transient requirements and qualification tests, unified test requirements and procedures are needed. The goal of these unified test procedures would be to insure a known susceptibility level for each newly designed electronic Line Replaceable Unit (LRU). Ten avionics equipments in current Air Force inventory were tested for the purpose of developing unified procedure test methods. Operating LRUs were subjected to transients using common mode cable current (CMCC), groung potentials and chatteriing relay cable injection methods. Based on observed test results and review of current test requirements, test methods and test levels for unified test procedures for power-on transient tests of avionics equipment have been formulated.

Published in:

IEEE Aerospace and Electronic Systems Magazine  (Volume:1 ,  Issue: 4 )