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Optical lever calibration in atomic force microscope with a mechanical lever

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4 Author(s)
Hui Xie ; Institut des Systèmes Intelligents et Robotique (ISIR), Université Pierre et Marie Curie-Paris, 6/CNRS 18 Route du Panorama-BP 61, 92265 Fontenay-Aux-Roses, France ; Vitard, Julien ; Haliyo, S. ; Regnier, S.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2976108 

A novel method that uses a small mechanical lever has been developed to directly calibrate the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The mechanical lever can convert the translation into a nanoscale rotation angle with a flexible hinge that provides an accurate conversion between the photodiode voltage output and torsional angle of a cantilever. During the calibration, the cantilever is mounted on a holder attached on the lever, which brings the torsional axis of the cantilever and rotation axis of the lever into line. By making use of its nanomotion on the Z-axis and using an external motion on the barrier, this device can complete the local and full-range lateral sensitivity calibrations of the optical lever without modifying the actual AFM or the cantilevers.

Published in:

Review of Scientific Instruments  (Volume:79 ,  Issue: 9 )