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Browse Journals & Magazines > Review of Scientific Instrume ...> Volume:79 Issue:3 Help

Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator

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7 Author(s)
An, Toshu ; The Institute for Solid State Physics, The University of Tokyo, 5-1-5 Kashiwa-no-ha, Kashiwa 277-8581, Japan and PRESTO, Japan Science and Technology Agency, Chiyoda-ku, Tokyo 102-0075, Japan ; Nishio, Takahiro ; Eguchi, Toyoaki ; Ono, Masanori
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Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2830937 

Low-temperature ultrahigh vacuum frequency-modulation atomic force microscopy (AFM) was performed using a 1 MHz length-extension type of quartz resonator as a force sensor. Taking advantage of the high stiffness of the resonator, the AFM was operated with an oscillation amplitude smaller than 100 pm, which is favorable for high spatial resolution, without snapping an AFM tip onto a sample surface. Atomically resolved imaging of the adatom structure on the Si(111)-(7×7) surface was successfully obtained.

Published in:
Review of Scientific Instruments  (Volume:79 ,  Issue: 3 )

Date of Publication: Mar 2008

Page(s):
033703 - 033703-6
ISSN :
0034-6748
Digital Object Identifier :
10.1063/1.2830937
Product Type:
Journals & Magazines
Date of Current Version :
18 June 2009
Issue Date :
Mar 2008

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