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Colloid probes with increased tip height for higher sensitivity in friction force microscopy and less cantilever damping in dynamic force microscopy

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3 Author(s)
Schmutz, Jan-Erik ; Center for Nanotechnology (CeNTech), Gievenbecker Weg 11, 48149 Münster, Germany and Physikalisches Institut, Westfälische Wilhelms Universität Münster, Wilhelm-Klemm-Str. 10, 48149 Münster, Germany ; Schafer, Marcus M. ; Holscher, Hendrik

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We present a method how to glue small spheres to atomic force microscope cantilevers. In difference to an often used approach where the sphere is glued to a tipless cantilever, we suggest to mount small spheres to a conventional cantilever with integrated tips modified by a focused ion beam. In this way it is possible to manufacture a spherical probe with increased tip height which enhances the sensitivity in friction force microscopy and reduces the cantilever damping in dynamic force microscopy. By milling cavities for the spheres at the tip apex the colloid particles can be attached at defined positions and contamination with glue can be prevented.

Published in:

Review of Scientific Instruments  (Volume:79 ,  Issue: 2 )

Date of Publication:

Feb 2008

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