Cart (Loading....) | Create Account
Close category search window

Pellet charge exchange helium measurement using neutral particle analyzer in large helical device

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Ozaki, T. ; High Energy Particle Group, Wave Heating Group and LHD Experimental Group, National Institute for Fusion Science, Toki, Gifu 509-5292, Japan ; Goncharov, P. ; Veshchev, E. ; Tamura, N.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

It is very important to investigate the confinement of α particles, which will be produced by nuclear reactions in ITER and fusion reactors. The pellet charge exchange (PCX) measurement is one of the most powerful methods because it can directly provide the profile of the α particle energy spectra in a plasma. In the large helical device, PCX using tracer encapsulated solid pellet (TESPEL) has been tried in many hydrogen and helium plasmas, including helium accelerated by using the cyclotron resonance heating. In the PCX, we use the compact neutral particle analyzer without simultaneous mass separation ability. The helium particle measurement can be achieved by the application of voltage in the condenser plate. The scattering of hydrogen particle is carefully considered during the estimation of the helium amount. The radial helium profiles can also be obtained by comparing four TESPEL injection shots with/without higher harmonic fast wave heating and at applied plate voltages for He or H, respectively.

Published in:

Review of Scientific Instruments  (Volume:79 ,  Issue: 10 )

Date of Publication:

Oct 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.