By Topic

Experimental setup for lensless imaging via soft x-ray resonant scattering

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Sacchi, Maurizio ; Synchrotron SOLEIL, L’Orme des Merisiers, Saint-Aubin-BP 48, 91192 Gif-sur-Yvette, France and Laboratoire de Chimie Physique-Matière et Rayonnement (UMR 7614), Université P. et M. Curie, 11 Rue P. et M. Curie, 75005 Paris, France ; Spezzani, Carlo ; Carpentiero, A. ; Prasciolu, Mauro
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2720726 

We have developed a setup for measuring holographically formed interference patterns using an integrated sample-mask design. The direct space image of the sample is obtained via a two-dimensional Fourier transform of the x-ray diffraction pattern. We present the details of our setup, commenting on the influence of geometrical parameters on the imaging capabilities. As an example, we present and discuss the results of test experiments on a patterned Co film.

Published in:

Review of Scientific Instruments  (Volume:78 ,  Issue: 4 )