Skip to Main Content
Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2720726
We have developed a setup for measuring holographically formed interference patterns using an integrated sample-mask design. The direct space image of the sample is obtained via a two-dimensional Fourier transform of the x-ray diffraction pattern. We present the details of our setup, commenting on the influence of geometrical parameters on the imaging capabilities. As an example, we present and discuss the results of test experiments on a patterned Co film.