Cart (Loading....) | Create Account
Close category search window

Dynamic atomic force microscopy operation based on high flexure modes of the cantilever

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Girard, P. ; Laboratoire d’Analyse des Interfaces et de Nanophysique (LAIN), UMR CNRS 5011, CC 082, Université Montpellier II, Place E. Bataillon, 34095 Montpellier Cedex, France ; Ramonda, M. ; Arinero, R.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

We show the interest of the high flexure modes of vibration for amplitude-controlled atomic force microscopy (AFM). In connection with AFM working conditions, we define the stabilization time threshold of the oscillating sensor. We show experimentally that, in both air and vacuum, the stabilization time decreases appreciably when the order of the flexure mode of the cantilever increases. Under ambient conditions, this increases the possible scan speeds by about one order of magnitude. Under vacuum and using standard sensors, the amplitude-controlled conditions are satisfied for harmonics equal to or higher than the second. Morphology imaging is then obtained. Thus, high flexure mode AFM easily extends the well known amplitude-controlled operations from ambient to vacuum environment, which allows new AFM applications.

Published in:

Review of Scientific Instruments  (Volume:77 ,  Issue: 9 )

Date of Publication:

Sep 2006

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.