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Dynamic atomic force microscopy operation based on high flexure modes of the cantilever

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3 Author(s)
Girard, P. ; Laboratoire d’Analyse des Interfaces et de Nanophysique (LAIN), UMR CNRS 5011, CC 082, Université Montpellier II, Place E. Bataillon, 34095 Montpellier Cedex, France ; Ramonda, M. ; Arinero, R.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2348634 

We show the interest of the high flexure modes of vibration for amplitude-controlled atomic force microscopy (AFM). In connection with AFM working conditions, we define the stabilization time threshold of the oscillating sensor. We show experimentally that, in both air and vacuum, the stabilization time decreases appreciably when the order of the flexure mode of the cantilever increases. Under ambient conditions, this increases the possible scan speeds by about one order of magnitude. Under vacuum and using standard sensors, the amplitude-controlled conditions are satisfied for harmonics equal to or higher than the second. Morphology imaging is then obtained. Thus, high flexure mode AFM easily extends the well known amplitude-controlled operations from ambient to vacuum environment, which allows new AFM applications.

Published in:

Review of Scientific Instruments  (Volume:77 ,  Issue: 9 )

Date of Publication:

Sep 2006

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