Cart (Loading....) | Create Account
Close category search window
 

Effect of magnetic field in electron-impact ion sources and simulation of electron trajectories

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Park, Chang J. ; Korea Research Institute of Standards and Science, Daejeon 305-600, Korea ; Ahn, Jong R.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2336756 

Effect of magnetic field has been studied for the electron-impact ion sources coupled with a quadrupole mass spectrometer. Computer simulation of electron trajectories showed better collimation and more helical rotations under stronger magnetic field, suggesting enhanced ionization efficiency. However, the magnetic field showed different effect on the mass spectrometer signals for different types of ion sources. For the cross beam ion source, where ion beam direction is perpendicular to the magnetic field, the mass spectrometer signals decreased when the magnetic field strength was higher than 20 G. For the axial ion source, where both the electron beam and ion beam are on the same axis of the magnetic field, the mass spectrometer signals increased almost linearly with the applied magnetic field intensity. The axial ion source with a magnet intensity of 800 G showed about five times improvement in mass spectrometer sensitivity compared with the cross beam ion source.

Published in:

Review of Scientific Instruments  (Volume:77 ,  Issue: 8 )

Date of Publication:

Aug 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.