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Apparatus for the imaging of infrared photoluminescence, transmittance, and phototransmittance with high spatial and spectral resolutions

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3 Author(s)
Furstenberg, R. ; Department of Physics, University of Illinois at Urbana-Champaign, 1110 W. Green Street, Urbana, Illinois 61801 ; Soares, Julio A. ; White, Jeffrey O.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2214931 

Photoluminescence is a widely used tool for the characterization of wide-gap semiconductor materials. However, most narrow-gap, infrared materials exhibit very weak, hard to detect photoluminescence. We report on the development of a sensitive, Fourier transform infrared (FTIR)-based apparatus capable of measuring and spatial imaging of weak infrared photoluminescence with diffraction limited resolution. The apparatus is also capable of measuring transmittance and phototransmittance. This is, to our knowledge, the first report of measuring infrared phototransmittance using an FTIR spectrometer.

Published in:

Review of Scientific Instruments  (Volume:77 ,  Issue: 7 )

Date of Publication:

Jul 2006

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