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Signal electronics equipped with a bandpass filter phase detector for noncontact atomic force microscopy (ncAFM) has been developed. A double quartz tuning fork assembly is used as a force sensor, where one fork serves as a dither tuning fork, while the other is used as a measuring tuning fork. An electrically conductive Pt90Ir10 tip enables the sensor to work in both scanning tunneling microscopy (STM) and AFM modes. Electronic circuits for self-oscillation control and for frequency detection are given in detail. Atomically resolved STM and ncAFM images of a thin alumina film on NiAl(110) are shown with the microscope cooled down to
Published in:
Review of Scientific Instruments
(Volume:77
,
Issue:
4
)
Date of Publication: Apr 2006
- Page(s):
- 043710 - 043710-8
- ISSN :
- 0034-6748
- Digital Object Identifier :
- 10.1063/1.2194490
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 18 June 2009
- Issue Date :
- Apr 2006
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