Close category search window
 

Electron cyclotron resonance plasma source by using Ku-band traveling-wave tube amplifier for broad ion-beam processing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Asaji, Toyohisa ; Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan and Development Center of Advanced Technology, Tateyama Machine Co., Ltd., 30 Shimonoban, Toyama 930-1305, Japan ; Sasaki, Hiroshi ; Kato, Yushi ; Sato, Fuminobu
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2148883 

A new electron cyclotron resonance (ECR) plasma source has been developed for broad ion-beam processing. A Ku-band traveling-wave tube amplifier (11–13 GHz) is adopted to generate high-density plasma under low-pressure conditions. An eight-pole magnetic field is selected to improve good uniformity and plasma confinement. The ECR zone for 11 GHz microwaves, i.e., 0.393 T, is formed within 6.5 mm of the inner wall of a chamber. The ECR plasma is generated by low microwave power (∼200 W). The radial profile of plasma density and electron temperature is measured with a Langmuir probe. The plasma density is approximately 3×1017 m-3 at the microwave power of 200 W. The uniformity of the density is within ±12.6% over 140 mm in diameter.

Published in:
Review of Scientific Instruments  (Volume:77 ,  Issue: 3 )

Date of Publication: Mar 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.