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DC built-in self-test for linear analog circuits

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3 Author(s)
Chatterjee, A. ; Georgia Inst. of Technol., Atlanta, GA, USA ; Kim, B.C. ; Nagi, N.

DC testing of analog circuits is cheaper than AC testing and covers many fault classes, including some that AC tests cannot detect. This efficient, low-cost, built-in self-test (BIST) methodology uses the checksum encodings of matrix representations to uncover faults that affect a circuit's DC transfer function

Published in:

Design & Test of Computers, IEEE  (Volume:13 ,  Issue: 2 )