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Analog testing with time response parameters

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3 Author(s)
Balivada, A. ; Center for Relativity, Texas Univ., Austin, TX, USA ; Chen, J. ; Abraham, J.A.

This paper describes a simple test generation technique which derives sinusoidal test waveforms that detect several fault classes. In addition, the authors show that certain stimuli will provoke variations in delay, rise time, and overshoot that indicate faulty behavior. Simple algorithms compute the different parameters

Published in:

Design & Test of Computers, IEEE  (Volume:13 ,  Issue: 2 )

Date of Publication:

Summer 1996

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