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Study of a high-resolution infrared spectrometer by using an integrated multigrating structure

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12 Author(s)
Han, Tao ; State Key Laboratory of Advanced Photonic Materials and Devices, Department of Optical Science and Engineering, Fudan University, Shanghai 200433, China ; Wu, Yun-Hua ; Chen, Jian-Ke ; Kong, Yu-Fei
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A new type of infrared spectrometer system working in the optical communication field has been studied and constructed. In order to achieve both high spectral resolution and fast data acquisition speed, an integrated grating with five subgratings and a set of five line-array InGaAs detectors are used to work in the 1450–1650 nm wavelength range without any scanning and mechanical moving parts. The system has been calibrated with a spectral resolution of about 0.08 nm and a fast data acquisition time of less than 40 ms (≫5 nm/ms) in the entire spectral range.

Published in:

Review of Scientific Instruments  (Volume:76 ,  Issue: 8 )

Date of Publication:

Aug 2005

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