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Near-field optical applications require the fast, stable, and reproducible fabrication of scanning near-field optical microscopy (SNOM) aperture probes in the submicrometer range. We have developed a stand-alone device for the electrolytic etching of nanoapertures with an integrated current and optical transmission monitoring and control. Probes with an aperture ranging from
Published in:
Review of Scientific Instruments
(Volume:76
,
Issue:
3
)
Date of Publication: Mar 2005