Cart (Loading....) | Create Account
Close category search window
 

Apparatus for Seebeck coefficient and electrical resistivity measurements of bulk thermoelectric materials at high temperature

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Zhou, Zhenhua ; Department of Physics, University of Michigan, Ann Arbor, Michigan 48109 ; Uher, Ctirad

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1835631 

A high temperature Seebeck coefficient and electrical resistivity measurement apparatus has been designed and built for measuring advanced thermoelectric materials. The apparatus covers the range of temperatures from 300 to 1300 K. Different sources of errors involved in the two measurements are discussed. The accuracy of the electrical resistivity measurement is estimated to be better than ±1% by measuring standard graphite sample from NIST.

Published in:

Review of Scientific Instruments  (Volume:76 ,  Issue: 2 )

Date of Publication:

Feb 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.