Cart (Loading....) | Create Account
Close category search window

Measurement of absolute electron density with a plasma impedance probe

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Blackwell, D.D. ; U.S. Naval Research Laboratory, Plasma Physics Division, Washington, DC ; Walker, D.N. ; Amatucci, W.E.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

A small spherical probe is used in conjunction with a network analyzer to determine the impedance of the probe-plasma system over a wide frequency range. Impedance curves are in good agreement with accepted circuit models with plasma-sheath and electron plasma frequency resonances easily identifiable. Clear transitions between capacitive and inductive modes as predicted by the model are identified. Sheath thickness and absolute electron density are determined from the location of these transitions. The absolute electron density indicated by the location of the impedance resonance is compared to measurements using the plasma oscillation method.

Published in:

Review of Scientific Instruments  (Volume:76 ,  Issue: 2 )

Date of Publication:

Feb 2005

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.