Cart (Loading....) | Create Account
Close category search window

Highly miniaturized laser ablation time-of-flight mass spectrometer for a planetary rover

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Rohner, Urs ; Physikalisches Institut, University of Bern, CH-3012 Bern, Switzerland ; Whitby, James A. ; Wurz, P. ; Barabash, Stas

Your organization might have access to this article on the publisher's site. To check, click on this link: 

We report the development and testing of a highly miniaturized mass spectrometer and ion source intended to be deployed on an airless planetary surface to measure the elemental and isotopic composition of solids, e.g., rocks and soils. Our design concentrates at this stage on the proposed BepiColombo mission to the planet Mercury. The mass analyzer is a novel combination of an electrostatic analyzer and a reflectron time-of-flight design. The ion source utilizes a laser induced plasma, which is directly coupled into the mass analyzer. Laser ablation gives high spatial resolution and avoids the need for sample preparation. Our prototype instrument has a demonstrated mass resolution m/Δm full width at half maximum in excess of 180 and a predicted dynamic range of better than five orders of magnitude. We estimate that a flight instrument would have a mass of 280 g (including laser and all electronics), a volume of 84 cm3, and could operate on 3 W power. © 2004 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:75 ,  Issue: 5 )

Date of Publication:

May 2004

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.