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Low temperature scanning contact potentiometry

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2 Author(s)
Reymond, S. ; DPMC, Université de Genève, Quai Ernest-Ansermet 24, 1211 Genève 4, Switzerland ; Fischer, O.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1646742 

We present a tool dedicated to potentiometric measurements over a length longer than the usual scanning length of local probes techniques, with a submicronic resolution, suitable for use in cryogenic environment. The measurement is carried out by bringing a conducting tip in contact with the sample surface. We describe in detail the connecting procedure and the inertial system used to move the sample. To illustrate the possibilities given by this system, we have measured the instantaneous voltage profile modified by Joule heating of a metallic bridge crossed by a high current density, and we have probed the potential profile across a normal-superconducting junction. © 2004 American Institute of Physics.

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Review of Scientific Instruments  (Volume:75 ,  Issue: 3 )