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Minimization of the acquisition time in energy dispersive x-ray diffraction measurements on disordered systems

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2 Author(s)
Rossi Albertini, V. ; Istituto di Struttura della Materia del C.N.R., Area della Ricerca di Tor Vergata, Via del fosso del cavaliere, 100, 00133 Rome, Italy ; Paci, B.

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The energy dispersive x-ray diffraction (EDXD) technique proved to be a powerful tool for the structural investigations of disordered systems. Although EDXD fulfills all of the characteristics required to study this class of samples, the adopted measurement procedure is not standard. This article focused on the optimization of the experimental setup required in order to minimize the acquisition time. We demonstrate that, in the symmetrical transmission geometry (usually adopted) and under very general experimental conditions, the quantities influencing the total time of measurement depend on only two free parameters, namely the sample thickness and the width of the energy spectrum of the primary beam. For this reason, despite the large number of variables involved in the problem, the final result can be summarized in a three-dimensional plot of the acquisition time as a function of these two independent parameters. Therefore, the plots allow the most convenient choice of the two parameters to minimize the measurement time, at a parity of statistical accuracy. On the other hand, it shows how an inappropriate setting may expand this time by several orders of magnitude. The method is applied to the two systems that have been most thoroughly investigated by EDXD, namely CCl4 and Hg. © 2004 American Institute of Physics.

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Review of Scientific Instruments  (Volume:75 ,  Issue: 3 )