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Improvement of detected intensity in confocal microscopy by using reflecting optical system

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3 Author(s)
Kang, DongKyun ; Department of Mechanical Engineering, Nano Opto Mechatronics Laboratory, Korea Advanced Institute of Science and Technology (KAIST), Gusung-dong, Yusung-gu, Daejeon 305-701, Korea ; Seo, JungWoo ; Gweon, DaeGab

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In confocal microscopy, the level of the detected intensity is low, which reduces the contrast of the images. We propose a reflecting optical system to improve the detected intensity. The result of the optimal design is presented and the performance of the resulting reflecting optical system is evaluated. A numerical simulation of the effect of the reflecting optical system on the total system performance is also presented. A standard specimen is imaged to show the benefits of the proposed reflecting optical system. The results in this Note demonstrate a 37% increase of the detected intensity and better contrast of the image. © 2004 American Institute of Physics.

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Review of Scientific Instruments  (Volume:75 ,  Issue: 2 )