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Highly efficient time-of-flight spectrometer for studying low-energy secondary emission from dielectrics: Secondary-electron emission from LiF film

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6 Author(s)
Samarin, S.N. ; Physics Department, University of Western Australia, Perth WA 6009, Australia ; Artamonov, O.M. ; Waterhouse, D.K. ; Kirschner, J.
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Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1537044 

A highly efficient time-of-flight electron spectrometer is described. An incident electron current of the order of 10-14A makes it suitable for studying secondary emission from dielectric surfaces. A microchannel plate position-sensitive detector allows flight distance correction while keeping a large acceptance angle. Measured energy distribution curves of secondary electrons generated from a LiF film by 19–31 eV incident electrons demonstrate good energy resolution and reveal reproducible and stable emission features at 2.6±0.3 eV, 7.2±0.3 eV, and 10.3±0.3 eV. © 2003 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:74 ,  Issue: 3 )

Date of Publication:

Mar 2003

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