We have designed and manufactured a flanged coaxial line as a sample holder for measuring the electromagnetic interference (EMI) shielding efficiency (SE) of planar materials in broadband frequency ranges up to 18 GHz. Connecting the samples holder to a vector network analyzer (50 MHz≤M≤13.5 GHz), we measured the S (scattering)-parameters and the EMI SE of copper (Cu) as a highly conducting material and emeraldine salt form of polyaniline (PAN–ES) as an intermediately conducting one. The measured EMI SEs of the materials from 50 MHz to 13.5 GHz were compared with those obtained from the conventional ASTM D4935-99 method and theoretical simulation using dc conductivity. We observed that the EMI SEs measured by using both experimental techniques agree with each other in the common frequency range (50 MHz∼1.5 GHz). The EMI shielding characteristics of samples such as the contribution of absorption and reflection to total EMI SE were analyzed through the measured S parameters. © 2003 American Institute of Physics.