Skip to Main Content
Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1532833
We present an electrochemical etching scheme for producing sharp tungsten tips for use in scanning probe microscopes. The motivation behind the development of this particular method comes from the need to have an etched probe attached to a quartz tuning fork. Comparisons with existing etching methods are made. This rather simple scheme incorporates the key advantages of previously established techniques to give reproducible and controlled etching cycles. © 2003 American Institute of Physics.