Close category search window
 

Comparison of force balance calibration techniques for the nano-Newton range

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Selden, Nathaniel P. ; University of Southern California, Department of Mechanical and Aerospace Engineering, Los Angeles, California 90089-1191 ; Ketsdever, Andrew D.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1623628 

With the rapid progress of micro- and nanoscale fabrication technology, devices are continually being created which produce extremely small forces. This creates a distinct need for a measurement instrument and adequate calibration techniques which can resolve forces below 1 μN. Two calibration methods for force balance measurements in the nano-Newton range are presented. These methods are based on a free molecule gas dynamic expansion through a thin-walled orifice and the electrostatic actuation of a miniature comb drive. Due to the advantages and disadvantages of every calibration technique, multiple techniques are often required to validate performance results for microscale devices. Because these calibration techniques typically rely on completely different physical processes and can be described by different sets of analytical equations, the comparison of one technique to another is necessary when high accuracy is required. The gas dynamic and electrostatic force calibration techniques have been compared and were found to agree to within 8% for force levels between 35 nano-Newtons and 1 μN. © 2003 American Institute of Physics.

Published in:
Review of Scientific Instruments  (Volume:74 ,  Issue: 12 )

Date of Publication: Dec 2003

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.