By Topic

Differential phase-shifting interferometry for in situ surface characterization during solution growth of crystals

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Booth, Nicholas A. ; Department of Chemical Engineering, University of Houston, 4800 Calhoun Road, Houston, Texas 77204-4004 ; Stanojev, Boris ; Chernov, Alexander A. ; Vekilov, Peter G.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

We have developed a phase-shifting interferometer for high-resolution in situ imaging of the interfacial morphology during the growth of fast-growing crystals from solution. We demonstrate that the evolution of the surface morphology can be captured as the height distribution over surface areas as large as 2×2 mm2 with a depth resolution of 3 nm and a lateral resolution down to 0.5 μm with a frequency of 10–12 surface images per second. We describe the five image phase-shifting algorithm and subsequent processing, which quantify the surface morphology and yield the height differences between surface features. We illustrate the application of the technique to the (101) face of potassium di-hydrogen phosphate crystals. We visualize and monitor the formation of step bunches on the surface of this crystal during growth. © 2002 American Institute of Physics.

Published in:

Review of Scientific Instruments  (Volume:73 ,  Issue: 10 )